dhr. O.K. Kiplagat : The Russian wheat aphid: Damage on Kenyan wheat varieties and possible control throug resistance breeding


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23 Feb 2005 16:00

Unit: Wageningen University

Location: Aula (gebouw 362), Gen. Foulkesweg 1, Wageningen

Promotor: prof.dr.ir. P. Stam (Plant Breeding - Selection Methods and Sustainable Resistance)

Co Promotor: dr.ir. I. Bos, prof.dr.ir. H.A. van Rheenen (Moi University, Eldoret, Kenia)

Seedlings and adult plants of Kenyan (Triticum eastivum) varieties were susceptible to the Russian wheat aphid (RWA) (Diuraphis noxia). Halt, one of the resistance sources from the USA was susceptible to the Kenyan RWA, indicating that the Kenyan isolate is a different biotype from those in the USA. RWA damage in seedlings was expressed mainly as leaf chlorosis and leaf rolling, while in adult plants the most serious damage was the reduction on seed set. RWA infestation also reduced the quality of the seeds produced. The line PI 294994 was a good source of RWA resistance but morphological and genetic variations were observed within the line. A single seed derived line from PI 294994 was selected as the resistance source in a Kenyan breeding programme. Work to identify molecular markers linked to the resistance RWA resistance gene in the PI 294994 derived line was initiated.

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